Hitachi S-4800 FE-STEM-EDS
The Hitachi S-4800 is a high-resolution field emission scanning electron microscope (FE-SEM), with a maximum scanning resolution of ~1 nm. The S-4800 housed in the Department of Chemistry is outfitted with a backscatter electron detector and transmission electron capabilities. It is equipped with an EDAX energy-dispersive X-ray spectroscopy (EDS) system that enables semi-quantitative elemental analysis and elemental phase mapping of samples.
SEM Industry Fees
SEM Academic Fees
CONTACT INFORMATION
SEM Lab Manager:
Nathan M. Rabideaux, Ph.D.
Research Analyst
Department of Chemistry
73 Warren Street
Newark, NJ 07102
(973) 353-5579